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Phys. Rev. E 80, 041604 (2009) [10 pages]

Reducing the surface roughness beyond the pulsed-laser-deposition limit

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E. Vasco1, C. Polop2, and J. L. Sacedón1
1Instituto de Ciencia de Materiales de Madrid, Consejo Superior de Investigaciones Científicas, 28049 Madrid, Spain
2Depto. Física de la Materia Condensada, Universidad Autónoma de Madrid, 28049 Madrid, Spain

Received 22 April 2009; revised 8 September 2009; published 23 October 2009

Here, we outline the theoretical fundamentals of a promising growth kinetics of films from the vapor phase, in which pulsed fluxes are combined with temperature transients to enable short-range surface relaxations (e.g., species rearrangements) and to inhibit long-range relaxations (atomic exchange between species). A group of physical techniques (fully pulsed thermal and/or laser depositions) based on this kinetics is developed that can be used to prepare films with roughnesses even lower than those obtained with pulsed-laser deposition, which is the physical vapor-phase deposition technique that has produced the flattest films reported so far.

© 2009 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevE.80.041604
DOI:
10.1103/PhysRevE.80.041604
PACS:
81.15.Aa, 68.55.−a, 68.43.Jk