Phys. Rev. E 80, 041604 (2009) [10 pages]Reducing the surface roughness beyond the pulsed-laser-deposition limitReceived 22 April 2009; revised 8 September 2009; published 23 October 2009 Here, we outline the theoretical fundamentals of a promising growth kinetics of films from the vapor phase, in which pulsed fluxes are combined with temperature transients to enable short-range surface relaxations (e.g., species rearrangements) and to inhibit long-range relaxations (atomic exchange between species). A group of physical techniques (fully pulsed thermal and/or laser depositions) based on this kinetics is developed that can be used to prepare films with roughnesses even lower than those obtained with pulsed-laser deposition, which is the physical vapor-phase deposition technique that has produced the flattest films reported so far. © 2009 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevE.80.041604
DOI:
10.1103/PhysRevE.80.041604
PACS:
81.15.Aa, 68.55.−a, 68.43.Jk
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