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Phys. Rev. E 76, 046403 (2007) [12 pages]

Soft-x-ray free-electron-laser interaction with materials

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Stefan P. Hau-Riege*, Richard A. London, and Henry N. Chapman
Lawrence Livermore National Laboratory, P.O. Box 808, Livermore, California 94551, USA

Magnus Bergh
Biomedical Center, Uppsala University, Box 576, SE 75123, Uppsala, Sweden

Received 18 June 2007; published 17 October 2007

Soft-x-ray free-electron lasers have enabled materials studies in which structural information is obtained faster than the relevant probe-induced damage mechanisms. We present a continuum model to describe the damage process based on hot-dense plasma theory, which includes a description of the energy deposition in the samples, the subsequent dynamics of the sample, and the detector signal. We compared the model predictions with experimental data and mostly found reasonable agreement. In view of future free-electron-laser performance, the model was also used to predict damage dynamics of samples and optical elements at shorter wavelengths and larger photon fluences than currently available.

© 2007 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevE.76.046403
DOI:
10.1103/PhysRevE.76.046403
PACS:
52.38.−r, 61.10.−i

*hauriege1@llnl.gov