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Phys. Rev. E 64, 061506 (2001) [9 pages]

Investigating the microenvironments of inhomogeneous soft materials with multiple particle tracking

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M. T. Valentine1, P. D. Kaplan2, D. Thota3, J. C. Crocker3,*, T. Gisler4, R. K. Prud’homme5, M. Beck6, and D. A. Weitz1,†
1Department of Physics and DEAS, Harvard University, Cambridge, Massachusetts 02138
2Unilever Research, Edgewater, New Jersey 07020
3Department of Physics and Astronomy, University of Pennsylvania, Philadelphia, Pennsylvania 19104
4Universität Konstanz, Fachbereich Physik, 78457 Konstanz, Germany
5Department of Chemical Engineering, Princeton University, Princeton, New Jersey 08544
6BASF AG, 67056 Ludwigshafen, Germany

Received 17 May 2001; revised 7 September 2001; published 21 November 2001

We develop a multiple particle tracking technique for making precise, localized measurements of the mechanical microenvironments of inhomogeneous materials. Using video microscopy, we simultaneously measure the Brownian dynamics of roughly one hundred fluorescent tracer particles embedded in a complex medium and interpret their motions in terms of local viscoelastic response. To help overcome the inherent statistical limitations due to the finite imaging volume and limited imaging times, we develop statistical techniques and analyze the distribution of particle displacements in order to make meaningful comparisons of individual particles and thus characterize the diversity and properties of the microenvironments. The ability to perform many local measurements simultaneously allows more precise measurements even in systems that evolve in time. We show several examples of inhomogeneous materials to demonstrate the flexibility of the technique and learn new details of the mechanics of the microenvironments that small particles explore. This technique extends other microrheological methods to allow simultaneous measurements of large numbers of probe particles, enabling heterogeneous samples to be studied more effectively.

© 2001 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevE.64.061506
DOI:
10.1103/PhysRevE.64.061506
PACS:
83.85.Ei, 83.10.Pp, 82.35.Pq, 62.25.+g

*Present address: Department of Chemical Engineering, University of Pennsylvania, Philadelphia, PA 19014.

Author to whom correspondence should be addressed. FAX: 617-495-2875. Email address: weitz@deas.harvard.edu