Phys. Rev. E 64, 050702(R) (2001) [4 pages]Orientational ordering in the chiral smectic-CFI2* liquid crystal phase determined by resonant polarized x-ray diffraction
High-resolution resonant polarized x-ray diffraction experiments near the sulfur K edge have been performed on free-standing liquid crystal films exhibiting the chiral smectic-CFI2* phase. It is widely accepted that this phase has a four-layer repeat unit, but the internal structure of the repeat unit remains controversial. We report different resolved features of the resonant x-ray diffraction peaks associated with the smectic-CFI2* phase that unambiguously demonstrate that the four-layer repeat unit is locally biaxial about the layer normal and that the measured angle, describing the biaxiality, is in good agreement with optical measurements. © 2001 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevE.64.050702
DOI:
10.1103/PhysRevE.64.050702
PACS:
61.30.Eb, 77.84.Nh, 78.70.Ck, 83.80.Xz
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