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Phys. Rev. E 62, 914–917 (2000)

Roughening, deroughening, and nonuniversal scaling of the interface width in electrophoretic deposition of polymer chains

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Frank W. Bentrem1, R. B. Pandey2, and Fereydoon Family3
1Program in Scientific Computing, The University of Southern Mississippi, Hattiesburg, Mississippi 39406-5046
2Department of Physics and Astronomy, The University of Southern Mississippi, Hattiesburg, Mississippi 39406-5046
3Department of Physics, Emory University, Atlanta, Georgia 30322

Received 25 June 1999; revised 13 January 2000; published in the issue dated July 2000

Growth and roughness of the interface of deposited polymer chains driven by a field onto an impenetrable adsorbing surface are studied by computer simulations in (2+1) dimensions. The evolution of the interface width W shows a crossover from short-time growth described by the exponent β1 to a long-time growth with exponent β2(>β1). The saturated width increases, i.e., the interface roughens, with the molecular weight Lc, but the roughness exponent α (from WsLα) becomes negative in contrast to models for particle deposition; α depends on the chain length—a nonuniversal scaling with the substrate length L. Roughening and deroughening occur as the field E and the temperature T compete such that Ws(A+BT)E-1/2.

© 2000 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevE.62.914
DOI:
10.1103/PhysRevE.62.914
PACS:
68.35.Ct, 61.41.+e, 81.15.Pq