Phys. Rev. E 53, 6413–6418 (1996)Measurement of subpicosecond electron pulsesReceived 30 August 1995; published in the issue dated June 1996 A bunch-length measuring method has been developed to measure the subpicosecond electron pulses generated at the Stanford University Short Intense Electron Source (SUNSHINE) facility. This method utilizes a far-infrared Michelson interferometer to measure coherent transition radiation emitted at wavelengths longer than or equal to the bunch length via optical autocorrelation. To analyze the measurement, a simple and systematic way has also been developed, which considers interference effects on the interferogram caused by the beam splitter; hence the electron bunch length can be easily obtained from the measurement. This simple, low-cost, frequency-resolved autocorrelation method demonstrates subpicosecond resolving power that cannot be achieved by existing time-resolved methods. © 1996 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevE.53.6413
DOI:
10.1103/PhysRevE.53.6413
PACS:
29.17.+w, 07.60.-j, 29.27.Fh, 41.75.Ht
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