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Phys. Rev. E 53, 6413–6418 (1996)

Measurement of subpicosecond electron pulses

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Hung-chi Lihn*, Pamela Kung, Chitrlada Settakorn, and Helmut Wiedemann
Applied Physics Department and Stanford Linear Accelerator Center, Stanford University, Stanford, California 94309

David Bocek
Physics Department and Stanford Linear Accelerator Center, Stanford University, Stanford, California 94309

Received 30 August 1995; published in the issue dated June 1996

A bunch-length measuring method has been developed to measure the subpicosecond electron pulses generated at the Stanford University Short Intense Electron Source (SUNSHINE) facility. This method utilizes a far-infrared Michelson interferometer to measure coherent transition radiation emitted at wavelengths longer than or equal to the bunch length via optical autocorrelation. To analyze the measurement, a simple and systematic way has also been developed, which considers interference effects on the interferogram caused by the beam splitter; hence the electron bunch length can be easily obtained from the measurement. This simple, low-cost, frequency-resolved autocorrelation method demonstrates subpicosecond resolving power that cannot be achieved by existing time-resolved methods.

© 1996 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevE.53.6413
DOI:
10.1103/PhysRevE.53.6413
PACS:
29.17.+w, 07.60.-j, 29.27.Fh, 41.75.Ht

*Electronic address: Wiedemann@SSRL01.SLAC.Stanford.edu